- Part Number
SN74BCT8374ADW
- Manufacturer
Texas Instruments
- Description
- IC SCAN TEST DEVICE W/FF 24-SOIC
- Category
- Integrated Circuits (ICs)
- Family
- Logic - Specialty Logic
- To learn about the specification of SN74BCT8374ADW, please search the datasheet by clicking the link above. If you couldn't find the correct datasheet, please refer to the manufacturer's official datasheet.
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Specifications of SN74BCT8374ADW
| Packaging | Tube | |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |
| Supply Voltage | 4.5 V ~ 5.5 V | |
| Number of Bits | 8 | |
| Operating Temperature | 0°C ~ 70°C | |
| Mounting Type | Surface Mount | |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) | |
| Supplier Device Package | 24-SOIC | |
| Other Names | 296-33849-5 SN74BCT8374ADW-ND SN74BCT8374ADWE4 SN74BCT8374ADWE4-ND SN74BCT8374ADWG4 SN74BCT8374ADWG4-ND | |
| call me | [email protected] | |
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